Rtec SMT-2000 Nanoindentation Tester
High-Precision Nanomechanical Characterization System
The Rtec SMT-2000 Nanoindentation Tester is an ultra-precise benchtop instrument engineered for the deep nanomechanical characterization of advanced materials, thin films, functional coatings, metals, polymers, and biomaterials. Powered by cutting-edge piezo actuation alongside advanced capacitive force and depth sensing technologies, the SMT-2000 delivers highly accurate measurements of hardness, elastic modulus, creep, relaxation, stiffness, and work of indentation at the nanoscale.
Fully compliant with international nanoindentation standards—including ISO 14577-1:2015, ASTM E2546-15, and ISO/TS 19278:2019 – the SMT-2000 is the premier solution for semiconductor manufacturers, coating developers, industrial QC facilities, and academic research laboratories.
As the trusted partner for Rtec Instruments in the region, LMS Technologies Pte Ltd provides dedicated local sales, application engineering support, professional installation, training, and comprehensive after-sales service throughout Singapore.
Fully compliant with international nanoindentation standards—including ISO 14577-1:2015, ASTM E2546-15, and ISO/TS 19278:2019 – the SMT-2000 is the premier solution for semiconductor manufacturers, coating developers, industrial QC facilities, and academic research laboratories.
As the trusted partner for Rtec Instruments in the region, LMS Technologies Pte Ltd provides dedicated local sales, application engineering support, professional installation, training, and comprehensive after-sales service throughout Singapore.
Key Features of the SMT-2000
- Precise Nanomechanical Analysis: Accurately evaluate Hardness (HIT and HVIT), Elastic Modulus (EIT) , Indentation Creep (CIT), Relaxation (RIT), and Work of Indentation (WIT) using continuous, real-time load-displacement analysis.
- Advanced Capacitive Sensor Technology: Equipped with high-resolution capacitive force and displacement sensors to guarantee flawless force and depth tracking throughout the entire indentation cycle.
- Closed-Loop Down Force Control: Features real-time tracking and control of applied loads, enabling programmable constant, linear, and step force profiles for advanced, specialized testing methodologies.
- Automated Motorized XYZ Positioning: A high-precision, automated XYZ stage with an ultra-fine 20 nm resolution allows for seamless indentation matrices, surface mapping studies, and unattended, high-throughput testing workflows.
- Compact, Acoustic & Vibration-Damped Design: Engineered with an integrated acoustic enclosure, built-in vibration damping, and a high resonance frequency of 250 Hz to guarantee stable, noise-free nanoscale measurements.
- Customizable Environmental Controls: Optional environmental chambers, including closed-loop humidity control, enable users to observe and analyze material behaviors under precisely regulated environmental conditions.
Versatile Industrial & R&D Applications
The SMT-2000 delivers uncompromising precision across Singapore’s core technology and engineering sectors:
- Semiconductors & Microelectronics: Assessing thin functional films, MEMS components, and wafer substrates.
- Surface Engineering: Characterizing hard protective coatings, multi-layer finishes, and metal alloys.
- Advanced Materials & Nanotechnology: Testing advanced ceramics, nanomaterials, polymers, and elastomers.
- Biomedical Engineering: Evaluating soft biomaterials, medical device coatings, and tissue interfaces.
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SPECIFICATIONS
BROCHURE
SPECIFICATIONS
| Parameter | Specification |
| Maximum Indentation Load | 500 mN |
| Load Resolution | 0.015 μN |
| Load Noise Floor (RMS) | 1 μN |
| Maximum Indentation Depth | 200 μm |
| Depth Resolution | 0.005 nm |
| Depth Noise Floor (RMS) | 0.1 nm |
| Data Acquisition Rate | 1 MHz |
| XYZ Stage Size | 50 × 120 × 15 mm |
| Enclosure Size | 40 × 40 × 40 cm |
| Weight | 30 kg |
| XYZ Stage Resolution | 20 nm |
| Frame Compliance | < 0.01 μm/N |
| Resonance Frequency | 250 Hz |
| Optical Microscope | Optional, 5 MP Camera |
| Standards | ISO 14577-1:2015, ASTM E2546-15, ISO/TS 19278:2019 |
BROCHURE
| SMT-2000 Nanoindentation Tester |  Free Download PDF >> |
INDENTATION AND SCRATCH TESTER
INDENTATION AND SCRATCH TESTER