DESKTOP SCANNING ELECTRON MICROSCOPE (SEM)
The Phenom Desktop SEM delivers high-resolution imaging and elemental analysis (with an integrated EDS detector) in a compact, easy-to-use design. Perfect for materials science, quality control, failure analysis, and academic research, this benchtop SEM combines speed, precision, and simplicity – enabling even first-time users to achieve professional-grade results in minutes.
Unlike traditional electron microscopes, the Phenom eliminates the need for dedicated facilities or extensive training. Its plug-and-play operation and automated workflows make it ideal for labs seeking fast SEM imaging and EDS analysis without compromising performance. Its low-vacuum mode accommodates conductive and non-conductive samples with minimal prep.
Unlike traditional electron microscopes, the Phenom eliminates the need for dedicated facilities or extensive training. Its plug-and-play operation and automated workflows make it ideal for labs seeking fast SEM imaging and EDS analysis without compromising performance. Its low-vacuum mode accommodates conductive and non-conductive samples with minimal prep.
Key advantages:
-
✔ High-resolution SEM imaging (up to nanometer scale)
✔ Energy-dispersive X-ray spectroscopy (EDS) for elemental mapping
✔ Compact SEM – no special room or infrastructure required
✔ Affordable SEM solution with low maintenance costs
Request a demo or quote today!
Available in: Singapore
Desktop Scanning Electron Microscope (SEM) Products
This high-performance desktop SEM offers integrated EDS for elemental analysis. It delivers <6nm (SE) and <8nm (BSE) resolution and magnifies up to 350,000x. An optional SE detector is also available.
Designed for large samples (100×100 mm) and automated workflows, this system offers <10 nm resolution, up to 200,000x magnification, and a 4.8-20 kV acceleration voltage. Optional integrated EDS and BSE detectors are available.
This high-performance desktop SEM offers integrated EDS for elemental analysis, achieving <6nm (SE) and <8nm (BSE) resolution and up to 350,000x magnification. An optional SE detector is available.
This high-performance desktop SEM offers <6nm (SE) and <8nm (BSE) resolution, up to 350,000x magnification, and an optional SE detector.
Entry-level desktop SEM with <15nm resolution, up to 175,000x magnification, and a long-life CeB6 source.
ParticleX automates SEM-EDS for unbiased quality control in steel, AM, GSR, TC, and battery industries, ensuring standards compliance.