3D OPTICAL PROFILOMETERS: PRECISION SURFACE METROLOGY SOLUTIONS IN SINGAPORE
As the authorized distributor for Rtec Instruments, LMS Technologies Pte Ltd is proud to bring the industry’s most advanced, non-contact 3D surface profiling technologies to Singapore’s leading research centers, universities, and industrial quality control (QC) laboratories.
The Rtec UP Series is engineered for excellence, providing the accurate, quantitative data required for advanced failure analysis, protective coating optimization, and precision materials characterization across the electronics, automotive, and aerospace sectors.
The Rtec UP Series is engineered for excellence, providing the accurate, quantitative data required for advanced failure analysis, protective coating optimization, and precision materials characterization across the electronics, automotive, and aerospace sectors.
Why Choose Rtec Instruments 3D Optical Profilers?
While traditional 2D optical microscopy often fails to provide quantitative depth and surface finish data, Rtec Instruments’ universal surface profiling platform closes the gap. By integrating multiple advanced optical imaging techniques into a single, seamless head, it offers unmatched versatility.
With sub-nanometer vertical resolution and high-speed multi-pixel color imaging, your team can instantly measure and analyze:
- Surface Roughness & Texture
- Step Height & Geometry
- Film Thickness & Multi-layer Mapping
Key Performance Advantages:
- Industry-Leading Speed: Features high-resolution cameras operating at 200–250 FPS+ for rapid area scanning and flawless image stitching.
- Ultimate Z-Axis Precision: State-of-the-art encoders deliver the highest vertical resolution available, remaining constant regardless of scanning distance or magnification.
- Multi-Mode Integrated Head: Switch between Spinning Disk Confocal Microscopy, White Light Interferometry (WLI), Dark Field, Bright Field, and Variable Focus imaging with a single click.
- Automated ISO Compliance: Generate quantitative reports with automated pass/fail criteria, ensuring high-throughput accuracy and minimizing operator error in professional QC environments.
Comprehensive Analysis for Every Industry
The Rtec UP Series features an open-frame design and customizable high-precision XY stages to accommodate a wide range of sample sizes and types:
Semiconductors & Electronics
Semiconductors & Electronics
- Full Wafer Inspection: Support for up to 300×300 mm wafers.
- Micro-Feature Tracking: Precision measurement of wafer bumps, pellicles, and microfluidic channels.
- Characterization: Real-time thickness determination and scratch testing analysis.
- Mapping: Multi-layer reflection mapping for complex optical coatings.
- Tribology Support: Detailed wear track analysis and volume loss calculations.
- Standardization: Roughness verification fully compliant with international ISO metrology standards.
Manufacturer’s website: https://rtec-instruments.com/
3D Optical Profilometers Products
Experience unmatched surface metrology versatility with the Rtec UP-5000. This flagship platform seamlessly integrates Spinning Disk Confocal, White Light Interferometry (WLI), Variable Focus, and Dark Field imaging into a single system. Engineered for high performance, it offers optional premium expansions-including AFM, Raman Spectroscopy, and Spectral Film Thickness-and easily accommodates large samples up to 300x300mm.
Engineered for daily high-throughput performance, the Rtec UP-3000 packs maximum metrology power into a compact footprint. This versatile system combines 5 core imaging modes-Confocal, Interferometry, Dark Field, Bright Field, and Variable Focus—into a single advanced head. Featuring dual dedicated high-speed cameras, it optimizes individual optical paths to deliver lightning-fast, uncompromising data accuracy without sacrificing bench space.
The Rtec UP-2000 is a highly focused, fully automated solution designed specifically to maximize the power of White Light Interferometry (WLI). Engineered for budget-conscious labs that demand elite performance, it delivers sub-nanometer Z-axis resolution without compromise. It is the perfect choice for high-precision profiling of surface roughness, flat step-heights, and topography on smooth, reflective, or highly textured samples.