Phenom Pharos G2 Desktop Field Emission Gun Scanning Electron Microscope (FEG-SEM)
Achieve high-quality imaging across disciplines with this tabletop Field-Emission Scanning Electron Microscope.
The Thermo Scientific Phenom Pharos G2 is the only desktop FE-SEM, offering the power of a floor-model without constraints. Building on the success of the original Phenom, the G2 maintains user-friendliness and a rapid workflow, achieving crisp images in about a minute. Its new Phenom interface integrates data and imaging on a single widescreen for intuitive control.
This self-contained system redefines FE-SEM performance, delivering superior image quality (2.0 nm at 20kV) and throughput. Hardware upgrades provide higher resolution, exceptional contrast, and clarity, even for sensitive samples. The expanded 1–20 kV range enables imaging of insulating and beam-sensitive materials without damage. Integrated EDS is now more seamless within the unified interface, simplifying elemental analysis and quantification. The Phenom Pharos G2 provides unparalleled performance and ease of use, delivering outstanding images effortlessly.
This self-contained system redefines FE-SEM performance, delivering superior image quality (2.0 nm at 20kV) and throughput. Hardware upgrades provide higher resolution, exceptional contrast, and clarity, even for sensitive samples. The expanded 1–20 kV range enables imaging of insulating and beam-sensitive materials without damage. Integrated EDS is now more seamless within the unified interface, simplifying elemental analysis and quantification. The Phenom Pharos G2 provides unparalleled performance and ease of use, delivering outstanding images effortlessly.
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Features
Unique field emission source
Unique among desktop SEMs, the Phenom Pharos G2 FEG-SEM offers a field emission source, which guarantees high brightness, crisp images, and stable beam current.
Gentle imaging
With a voltage range down to 1 kV, the Phenom Pharos G2 FEG-SEM enables imaging of beam-sensitive samples, such as polymers, as well as insulating samples, without the requirement to apply a coating. As a result, nanoscale surface features are not obscured.
A world of information
On the Phenom Pharos G2 FEG-SEM, morphological information is acquired together with compositional information, thanks to SE, BSE, and EDS detectors built into the system. A range of sample holders is available for temperature-controlled or electrical experiments.
Excellent resolving power
The Phenom Pharos G2 FEG-SEM offers a resolution of 2.0 nm at 20 kV. Such performance shows the shape of nanoparticles, imperfections in coatings, or other features that would be missed by tungsten SEMs or other tabletop SEMs.
Higher productivity
While FEG SEMs have a reputation for being difficult to accommodate and difficult to operate, the Phenom Pharos G2 FEG-SEM literally requires only a desk, and less than one hour of training. Master students, visitors, or other researchers typically not trained to work on high-end FEG SEMs can easily use the Phenom Pharos G2 FEG-SEM to create eye-catching images.
Specifications
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| Electron optical magnification range |
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| Light optical magnification |
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| Vacuum modes |
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DESKTOP SCANNING ELECTRON MICROSCOPE (SEM)
DESKTOP SCANNING ELECTRON MICROSCOPE (SEM)