Rtec UP-2000 3D Optical Profilometer: Specialized WLI Precision & Automated Metrology
LMS Technologies Pte Ltd presents the Rtec UP-2000, a highly focused 3D optical profilometer designed for laboratories, universities, and industrial quality assurance facilities in Singapore. As the most streamlined entry in the Rtec UP Series, the UP-2000 is engineered to provide premium, non-contact surface topography measurements in a compact, highly efficient, and budget-friendly package.
Precision Engineering for Targeted Analysis
Built to deliver industrial-grade reliability, the UP-2000 features a high-precision cross-roller XY stage and a versatile 150 x 200 x 150 mm travel configuration. This system is specifically optimized for automated surface characterization, allowing research teams and high-throughput production lines to achieve sub-nanometer Z-axis resolution with ease and repeatability.
Optimized Optical Capabilities
The UP-2000 streamlines the metrology workflow by combining advanced surface profiling techniques with a fully automated, user-friendly interface. It allows operators to capture quantitative, high-fidelity topographical data without the need for manual sample adjustment.
- White Light Interferometry (WLI): The gold standard for flat, smooth, or reflective substrates. By utilizing internal reference mirrors to recombine light, the system produces immaculate 2D and 3D height maps. This mode ensures industry-leading sub-nanometer Z-axis resolution that remains consistent regardless of the objective magnification chosen.
- Variable Focus Imaging: Engineered for rapid shape tracking and geometric analysis. This mode excels at quickly building sharp, fully focused 3D models of complex geometries, rough surfaces, and irregular textures, making it ideal for high-speed scanning tasks.
- Intelligent Auto-Stitching: Paired with high-speed camera technology, the UP-2000 supports seamless, automated image stitching. This capability allows for wide-area mapping across unlimited X and Y coordinates, ensuring that even large components can be analyzed at maximum magnification.
Why Choose the Rtec UP-2000?
The UP-2000 is the ideal choice for facilities that need to prioritize specific metrology functions without the complexity of a multi-mode system. By focusing its design on WLI and Variable Focus imaging, the UP-2000 removes unnecessary overhead while retaining the elite performance required for modern material science and QC applications.
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SPECIFICATIONS
BROCHURE
SPECIFICATIONS
| XYZ Stage Travel Range | 150 x 200 x 150mm (High-precision cross-roller XY stage) |
| Z-Axis Encoder | Advanced high-resolution encoder with 150-mm travel |
| Core Profiling Modes | White Light Interferometry (WLI), Variable Focus Imaging |
| Interferometry Vertical Resolution | Better than 0.01 nm |
| Interferometry RMS Repeatability | 0.01 nm |
| WLI Light Sources | User-selectable 4-color LED (White, Red-630nm, Green-530nm, Blue-460nm) |
| Scanning Speed Capabilities | High-speed cameras running 250 FPS+ for rapid area coverage |
BROCHURE
| 3D Optical Profilometers UP Series-2026 |  Free Download PDF >> |
3D OPTICAL PROFILMETERS
3D OPTICAL PROFILMETERS