LMS Technologies Pte Ltd

Phenom ParticleX AM Desktop SEM

Desktop SEM for additive manufacturing analysis, capable of observing large samples up to 100 mm x 100 mm.

The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a versatile SEM specifically designed for additive manufacturing, providing high purity at the microscale.

Its chamber accommodates samples as large as 100 mm x 100 mm. The innovative venting and loading mechanism ensures the quickest vent/load cycle in the industry, maximizing throughput.
With the Phenom ParticleX AM Desktop SEM, you gain full control of your data in-house:
  • Monitor essential characteristics of metal powders
  • Optimize powder-bed and powder-fed additive manufacturing processes
  • Identify particle size distributions, individual particle morphology, and foreign particles.
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Features

Additive manufacturing testing

The Phenom ParticleX AM Desktop SEM measures particle size and shape (diameter, perimeter, aspect ratio, roughness, Feret diameter) and displays results as d10, d50, and d90 values.

SEM particle analysise

The Phenom ParticleX AM Desktop SEM offers a 100 mm x 100 mm chamber with a fast motorized stage. Its proprietary loading shuttle delivers a 60-second vent/load cycle, providing superior throughput.

SEM elemental mapping

Single-click elemental mapping and line scans provide quantified element distribution via a line plot, useful for analyzing edges, coatings, and multilayer samples.

Secondary electron detector

The optional SED on the Phenom ParticleX AM Desktop SEM provides detailed surface information by collecting low-energy electrons, useful for topography and morphology analysis, especially for microstructures, fibers, and particles.

Specifications

Electron optical
  • Long lifetime thermionic source (CeB₆)
  • Multiple beam currents
Electron optical magnification range
  • 160 – 200,000x
Light optical magnification
  • 3 – 16x
Resolution
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low – medium – high
Detector
  • Energy dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm (h)
Sample loading time
  • Light optical <5 s
  • Electron optical <60 s
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PHENOM PARTICLEX DESKTOP SEM
PHENOM PARTICLEX DESKTOP SEM
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