Phenom ParticleX Battery Desktop SEM
Desktop scanning electron microscope for battery production and research
In battery development and manufacturing, material purity is paramount. Even trace contaminants in materials like NCM powder can severely impact product performance. The Phenom Desktop SEM, designed specifically for battery materials analysis, provides high-resolution SEM imaging coupled with EDS for chemical identification. When automated, this combination delivers a powerful solution for rigorous powder quality inspection.
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Features
Conductance classifications
Each particle class can be labeled with a conductance of the particles, allowing you to sort on conductance of particles. This allows you to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination.
Ternary diagram
To view overall chemistry of the particle population, a ternary diagram can be generated where all particles are represented. With Ni, Co, and Mn on each axis, the outyears and general trends can be seen instantly.
Specifications
| Electron optical |
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| Electron optical magnification range |
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| Light optical magnification |
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| Resolution |
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| Image resolution options |
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| Acceleration voltages |
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| Vacuum levels |
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| Detector |
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| Sample size |
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| Sample loading time |
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PHENOM PARTICLEX DESKTOP SEM
PHENOM PARTICLEX DESKTOP SEM